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eol produ ct document no. e0315e21 (ver. 2.1) date published march 2006 (k) japan url: http://www.elpida.com ? elpida memory, inc. 2002-2006 data sheet 512mb direct rambus ? dram rimm ? module ebr51ec8abfd (256m words 18 bits) description the direct rambus rimm module is a general-purpose high-performance memory module subsystem suitable for use in a broad range of applications including computer memory, personal computers, workstations, and other applications where high bandwidth and low latency are required. the ebr51ec8abfd consists of 16 pieces of 288m direct rambus dram (direct rdram ? ) devices. these are extremely high-speed cmos drams organized as 16m words by 18 bits. the use of rambus signaling level (rsl) technology permits 1066mhz or 800mhz transfer rates while using conventional system and board design technologies. the architecture of the direct rdram enables the highest sustained bandwidth for multiple, simultaneous, randomly addressed memory transactions. the separate control and data buses with independent row and column control yield over 95% bus efficiency. the direct rdram device's 32 banks support up to four simultaneous transactions per device. features ? 512mb direct rdram storage and 512 banks total on module ? high speed 1066mhz/800mhz direct rdram devices ? 184 edge connector pads with 1mm pad spacing ? module pcb size: 133.35mm 34.925mm 1.27mm ? gold plated edge connector pads contacts ? serial presence detect (spd) support ? operates from a 2.5v supply ? low power and power down self refresh modes ? separate row and column buses for higher efficiency ? rdram ? devices use chip scale package (csp) ? fbga package
eol produ ct ebr51ec8abfd data sheet e0315e21 (ver. 2.1) 2 ordering information part number organization i/o freq. (mhz) ras access time (ns) package mounted devices ebr51ec8abfd-aep 256m x 18 1066 32 (32p) 184 edge connector pads rimm with heat spreader edr2518abse ebr51ec8abfd-ae 32 edge connector: gold plated ebr51ec8abfd-ad 35 EBR51EC8ABFD-8C 800 40 module pad names pad signal name pad signal name pad signal name pad signal name a1 gnd b1 gnd a47 nc b47 nc a2 ldqa8 b2 ldqa7 a48 nc b48 nc a3 gnd b3 gnd a49 nc b49 nc a4 ldqa6 b4 ldqa5 a50 nc b50 nc a5 gnd b5 gnd a51 vref b51 vref a6 ldqa4 b6 ldqa3 a52 gnd b52 gnd a7 gnd b7 gnd a53 scl b53 sa0 a8 ldqa2 b8 ldqa1 a54 vdd b54 vdd a9 gnd b9 gnd a55 sda b55 sa1 a10 ldqa0 b10 lcfm a56 svdd b56 svdd a11 gnd b11 gnd a57 swp b57 sa2 a12 lctmn b12 lcfmn a58 vdd b58 vdd a13 gnd b13 gnd a59 rsck b59 rcmd a14 lctm b14 nc a60 gnd b60 gnd a15 gnd b15 gnd a61 rdqb7 b61 rdqb8 a16 nc b16 lrow2 a62 gnd b62 gnd a17 gnd b17 gnd a63 rdqb5 b63 rdqb6 a18 lrow1 b18 lrow0 a64 gnd b64 gnd a19 gnd b19 gnd a65 rdqb3 b65 rdqb4 a20 lcol4 b20 lcol3 a66 gnd b66 gnd a21 gnd b21 gnd a67 rdqb1 b67 rdqb2 a22 lcol2 b22 lcol1 a68 gnd b68 gnd a23 gnd b23 gnd a69 rcol0 b69 rdqb0 a24 lcol0 b24 ldqb0 a70 gnd b70 gnd a25 gnd b25 gnd a71 rcol2 b71 rcol1 a26 ldqb1 b26 ldqb2 a72 gnd b72 gnd a27 gnd b27 gnd a73 rcol4 b73 rcol3 a28 ldqb3 b28 ldqb4 a74 gnd b74 gnd a29 gnd b29 gnd a75 rrow1 b75 rrow0 a30 ldqb5 b30 ldqb6 a76 gnd b76 gnd a31 gnd b31 gnd a77 nc b77 rrow2 a32 ldqb7 b32 ldqb8 a78 gnd b78 gnd a33 gnd b33 gnd a79 rctm b79 nc a34 lsck b34 lcmd a80 gnd b80 gnd
eol produ ct ebr51ec8abfd data sheet e0315e21 (ver. 2.1) 3 pad signal name pad signal name pad signal name pad signal name a35 vcmos b35 vcmos a81 rctmn b81 rcfmn a36 sout b36 sin a82 gnd b82 gnd a37 vcmos b37 vcmos a83 rdqa0 b83 rcfm a38 nc b38 nc a84 gnd b84 gnd a39 gnd b39 gnd a85 rdqa2 b85 rdqa1 a40 nc b40 nc a86 gnd b86 gnd a41 vdd b41 vdd a87 rdqa4 b87 rdqa3 a42 vdd b42 vdd a88 gnd b88 gnd a43 nc b43 nc a89 rdqa6 b89 rdqa5 a44 nc b44 nc a90 gnd b90 gnd a45 nc b45 nc a91 rdqa8 b91 rdqa7 a46 nc b46 nc a92 gnd b92 gnd
eol produ ct ebr51ec8abfd data sheet e0315e21 (ver. 2.1) 4 module connector pad description signal module connector pads i/o type description gnd a1, a3, a5, a7, a9, a11, a13, a15, a17, a19, a21, a23, a25, a27, a29, a31, a33, a39, a52, a60, a62, a64, a66, a68, a70, a72, a74, a76, a78, a80, a82, a84, a86, a88, a90, a92, b1, b3, b5, b7, b9, b11, b13, b15, b17, b19, b21, b23, b25, b27, b29, b31, b33, b39, b52, b60, b62, b64, b66, b68, b70, b72, b74, b76, b78, b80, b82, b84, b86, b88, b90, b92 ? ? ground reference for rdram core and interface. 72 pcb connector pads. lcfm b10 i rsl clock from master. interface clock used for receiving rsl signals from the channel. positive polarity. lcfmn b12 i rsl clock from master. interface clock used for receiving rsl signals from the channel. negative polarity. lcmd b34 i vcmos serial command used to read from and write to the control registers. also used for power management. lcol4..lcol0 a20, b20, a22, b22, a24 i rsl column bus. 5-bit bus containing control and address information for column accesses. lctm a14 i rsl clock to master. interface clock used for transmitting rsl signals to the channel. positive polarity. lctmn a12 i rsl clock to master. interface clock used for transmitting rsl signals to the channel. negative polarity. ldqa8..ldqa0 a2, b2,a4, b4, a6, b6, a8, b8, a10 i/o rsl data bus a. a 9-bit bus carrying a byte of read or write data between the channel and the rdram. ldqb8..ldqb0 b32, a32, b30, a30, b28, a28, b26, a26, b24 i/o rsl data bus b. a 9-bit bus carrying a byte of read or write data between the channel and the rdram. lrow2..lrow0 b16, a18, b18 i rsl row bus. 3-bit bus containing control and address information for row accesses. lsck a34 i vcmos serial clock input. clock source used to read from and write to the rdram control registers. nc a16, b14, a38, b38, a40, b40, a77, b79, a43, b43, a44, b44, a45, b45, a46, b46, a47, b47, a48, b48, a49, b49, a50, b50 ? ? these pads are not connect ed. these 24 connector pads are reserved for future use. rcfm b83 i rsl clock from master. interface clock used for receiving rsl signals from the channel. positive polarity. rcfmn b81 i rsl clock from master. interface clock used for receiving rsl signals from the channel. negative polarity. rcmd b59 i vcmos serial command input used to read from and write to the control registers. also used for power management. rcol4..rcol0 a73, b73, a71, b71, a69 i rsl column bus. 5-bit bus containing control and address information for column accesses. rctm a79 i rsl clock to master. interface clock used for transmitting rsl signals to the channel. positive polarity. rctmn a81 i rsl clock to master. interface clock used for transmitting rsl signals to the channel. negative polarity. rdqa8..rdqa0 a91, b91, a89, b89, a87, b87, a85, b85, a83 i/o rsl data bus a. a 9-bit bus carrying a byte of read or write data between the channel and the rdram. rdqb8..rdqb0 b61, a61, b63, a63, b65, a65, b67, a67, b69 i/o rsl data bus b. a 9-bit bus carrying a byte of read or write data between the channel and the rdram. rrow2..rrow0 b77, a75, b75 i rsl row bus. 3-bit bus containing control and address information for row accesses.
eol produ ct ebr51ec8abfd data sheet e0315e21 (ver. 2.1) 5 signal module connector pads i/o type description rsck a59 i vcmos serial clock input. clock source used to read from and write to the rdram control registers. sa0 b53 i svdd serial presence detect address 0. sa1 b55 i svdd serial presence detect address 1. sa2 b57 i svdd serial presence detect address 2. scl a53 i svdd serial presence detect clock. sda a55 i/o svdd serial presence detect data (open collector i/o). sin b36 i/o vcmos serial i/o for reading from and writing to the control registers. attaches to sio0 of the first rdram on the module. sout a36 i/o vcmos serial i/o for reading from and writing to the control registers. attaches to sio1 of the last rdram on the module. svdd a56, b56 ? ? spd voltage. used for signals scl, sda, swp, sa0, sa1 and sa2. swp a57 i svdd serial presence detect write protect (active high). when low, the spd can be written as well as read. vcmos a35, b35, a37, b37 ? ? cmos i/o voltage. used for signals cmd, sck, sin, sout. vdd a41, a42, a54, a58, b41, b42, b54, b58 ? ? supply voltage for the rdram core and interface logic. vref a51, b51 ? ? logic threshold reference voltage for rsl signals.
eol produ ct ebr51ec8abfd data sheet e0315e21 (ver. 2.1) 6 block diagram ldqa 8 ldqa 7 ldqa 6 ldqa 5 ldqa 4 ldqa 3 ldqa 2 ldqa 1 ldqa 0 lcfm lcfmn lctm lctmn lrow 2 lrow 1 lrow 0 lcol 4 lcol 3 lcol 2 lcol 1 lcol 0 ldqb 0 ldqb 1 ldqb 2 ldqb 3 ldqb 4 ldqb 5 ldqb 6 ldqb 7 ldqb 8 rdqa 8 rdqa 7 rdqa 6 rdqa 5 rdqa 4 rdqa 3 rdqa 2 rdqa 1 rdqa 0 rcfm rcfmn rctm rctmn rrow 2 rrow 1 rrow 0 rcol 4 rcol 3 rcol 2 rcol 1 rcol 0 rdqb 0 rdqb 1 rdqb 2 rdqb 3 rdqb 4 rdqb 5 rdqb 6 rdqb 7 rdqb 8 dqa 8 dqa 7 dqa 6 dqa 5 dqa 4 dqa 3 dqa 2 dqa 1 dqa 0 cfm cfmn ctm ctmn row 2 row 1 row 0 col 4 col 3 col 2 col 1 col 0 dqb 0 dqb 1 dqb 2 dqb 3 dqb 4 dqb 5 dqb 6 dqb 7 dqb 8 sio 0 sio 1 sck cmd v ref sio 0 sio 1 sck cmd v ref dqa 8 dqa 7 dqa 6 dqa 5 dqa 4 dqa 3 dqa 2 dqa 1 dqa 0 cfm cfmn ctm ctmn row 2 row 1 row 0 col 4 col 3 col 2 col 1 col 0 dqb 0 dqb 1 dqb 2 dqb 3 dqb 4 dqb 5 dqb 6 dqb 7 dqb 8 sio 0 sio 1 sck cmd v ref dqa 8 dqa 7 dqa 6 dqa 5 dqa 4 dqa 3 dqa 2 dqa 1 dqa 0 cfm cfmn ctm ctmn row 2 row 1 row 0 col 4 col 3 col 2 col 1 col 0 dqb 0 dqb 1 dqb 2 dqb 3 dqb 4 dqb 5 dqb 6 dqb 7 dqb 8 sio 0 sio 1 sck cmd v ref sin lsck lcmd v ref sout rsck rcmd u1 u2 u3 u16 dqa 8 dqa 7 dqa 6 dqa 5 dqa 4 dqa 3 dqa 2 dqa 1 dqa 0 cfm cfmn ctm ctmn row 2 row 1 row 0 col 4 col 3 col 2 col 1 col 0 dqb 0 dqb 1 dqb 2 dqb 3 dqb 4 dqb 5 dqb 6 dqb 7 dqb 8 v dd v cmos scl sda a0 a1 scl sa0 sa1 serial pd a2 sa2 wp swp u0 vcc svdd sda note: 1. rambus channel signals form a loop through t he rimm module, with the exc eption of the sio chain. 2. see serial presence detectio n specification for information on the spd device and its contents.
eol produ ct ebr51ec8abfd data sheet e0315e21 (ver. 2.1) 7 electrical specifications absolute maximum ratings symbol parameter min. max. unit vi,abs voltage applied to any rsl or cmos signal pad with respect to gnd ? 0.3 vdd + 0.3 v vdd,abs voltage on vdd with respect to gnd ? 0.5 vdd + 1.0 v tstore storage temperature ? 50 +100 c caution exposing the device to stress above those listed in absolute maximum ratings could cause permanent damage. the device is not meant to be operated under conditions outside the limits described in the operational section of this sp ecification exposure to absolute maximum rating conditions for extended periods may affect device reliability. dc recommended electrical conditions symbol parameter and conditions min. max. unit vdd supply voltage* 1 2.50 ? 0.13 2.50 + 0.13 v vcmos cmos i/o power supply at pad 2.5v controllers 2.50 ? 0.13 2.50 + 0.25 v 1.8v controllers 1.8 ? 0.1 1.8 + 0.2 v vref reference voltage* 1 1.4 ? 0.2 1.4 + 0.2 v svdd serial presence detector- positive power supply 2.2 3.6 v note: see direct rdram datasheet for more details.
eol produ ct ebr51ec8abfd data sheet e0315e21 (ver. 2.1) 8 ac electrical specifications symbol parameter and conditions grade min. typ. max. unit z module impedance of rsl signals 25.2 28.0 30.8 ? module impedance of sck and cmd signals 23.8 28.0 32.2 ? tpd average clock delay from finger to finger of all rsl clock nets (ctm, ctmn,cfm, and cfmn) ? ? 2.11 ns ? tpd propagation delay variation of rsl signals with respect to tpd * 1, 2 -24 ? 24 ps ? tpd-cmos propagation delay variation of sck signal with respect to an average clock delay * 1 -250 ? 250 ps ? tpd- sck,cmd propagation delay variation of cmd signal with respect to sck signal -200 ? 200 ps v /vin attenuation limit -aep -ae -ad -8c ? ? 27.0 % vxf/vin forward crosstalk coefficient (300ps input rise time 20% - 80%) -aep -ae -ad -8c ? ? 8.0 % vxb/vin backward crosstalk coefficient (300ps input rise time 20% - 80%) -aep -ae -ad -8c ? ? 2.5 % rdc dc resistance limit -aep -ae -ad -8c ? ? 1.2 ? notes 1. tpd or average clock delay is defined as the average delay from fi nger to finger of all rsl clock nets (ctm, ctmn, cfm, and cfmn). 2. if the rimm module meets the foll owing specification, then it is compliant to the specification. if the rimm module does not meet thes e specifications, then the specif ication can be adjusted by the ?adjusted ? tpd specification? table. adjusted ? tpd specification absolute symbol parameter and conditions adjusted min./max. min. max. unit ? tpd propagation delay variation of rsl signals with respect to tpd +/ ? [24+(18*n* ? z0)] * 1 -50 50 ps note: 1 n = number of rdram devices installed on the rimm module. ? z0 = delta z0% = (max. z0 - min. z0) / (min. z0) (max. z0 and min. z0 are obtained from the lo aded (high impedance) impedance coupons of all rsl layers on the module.)
eol produ ct ebr51ec8abfd data sheet e0315e21 (ver. 2.1) 9 rimm module current profile idd rimm module power conditions * 1 grade max. unit idd1 one rdram device in read * 2 , balance in nap mode -aep, -ae, -ad -8c 720 580 ma idd2 one rdram device in read * 2 , balance in standby mode -aep, -ae, -ad -8c 2010 1570 ma idd3 one rdram device in read * 2 , balance in active mode -aep, -ae, -ad -8c 2610 2020 ma idd4 one rdram device in write, balance in nap mode -aep, -ae, -ad -8c 740 590 ma idd5 one rdram device in write, balance in standby mode -aep, -ae, -ad -8c 2030 1580 ma idd6 one rdram device in write, balance in active mode -aep, -ae, -ad -8c 2630 2030 ma notes: 1. actual power will depend on individual rdram component specifications, memory controller and usage patterns. power does not include refresh current. 2. i/o current is a function of the % of 1?s, to ad d i/o power for 50 % 1?s for a x18 need to add 276ma for the following: vdd = 2.5v, vterm = 1.8v, vref = 1.4v and vdil = vref ? 0.5v.
eol produ ct ebr51ec8abfd data sheet e0315e21 (ver. 2.1) 10 physical outline pad a1 pad a92 eca-ts2-0080-01 133.35 32.0 11.50 45.00 45.00 55.175 17.78 4.00 0.10 detail of a part r1.00 2.000.10 0.80 3.00 0.10 2.99 a 1.00 unit: mm note: the dimensions without tolerance specification use the default tolerance of 0.13. 5.68 66.675 r2.00 0.30 0.10 34.925 7.55 max 1.270.10
eol produ ct ebr51ec8abfd data sheet e0315e21 (ver. 2.1) 11 caution for handling memory modules when handling or inserting memory modules, be sure not to touch any components on the modules, such as the memory ics, chip capacitors and chip resistors. it is necessary to avoid undue mechanical stress on these components to prevent damaging them. in particular, do not push module cover or drop the modules in order to protect from mechanical defects, which would be electrical defects. when re-packing memory modules, be sure the modules are not touching each other. modules in contact with other modules may cause excessive mechanical stress, which may damage the modules. mde0202 notes for cmos devices 1 precaution against esd for mos devices exposing the mos devices to a strong electric field can cause destruction of the gate oxide and ultimately degrade the mos devices operation. steps must be taken to stop generation of static electricity as much as possible, and quickly dissipate it, when once it has occurred. environmental control must be adequate. when it is dry, humidifier should be used. it is recommended to avoid using insulators that easily build static electricity. mos devices must be stored and transported in an anti-static container, static shielding bag or conductive material. all test and measurement tools including work bench and floor should be grounded. the operator should be grounded using wrist strap. mos devices must not be touched with bare hands. similar precautions need to be taken for pw boards with semiconductor mos devices on it. 2 handling of unused input pins for cmos devices no connection for cmos devices input pins can be a cause of malfunction. if no connection is provided to the input pins, it is possible that an internal input level may be generated due to noise, etc., hence causing malfunction. cmos devices behave differently than bipolar or nmos devices. input levels of cmos devices must be fixed high or low by using a pull-up or pull-down circuitry. each unused pin should be connected to v dd or gnd with a resistor, if it is considered to have a possibility of being an output pin. the unused pins must be handled in accordance with the related specifications. 3 status before initialization of mos devices power-on does not necessarily define initial status of mos devices. production process of mos does not define the initial operation status of the device. immediately after the power source is turned on, the mos devices with reset function have not yet been initialized. hence, power-on does not guarantee output pin levels, i/o settings or contents of registers. mos devices are not initialized until the reset signal is received. reset operation must be executed immediately after power-on for mos devices having reset function. cme0107
eol produ ct ebr51ec8abfd data sheet e0315e21 (ver. 2.1) 12 rambus, rdram and the rambus logo are regi stered trademarks of rambus inc. direct rambus, direct rdram, rimm, so-rimm and qrsl are trademarks of rambus inc. m01e0107 no part of this document may be copied or reproduced in any form or by any means without the prior written consent of elpida memory, inc. elpida memory, inc. does not assume any liability for infringement of any intellectual property rights (including but not limited to patents, copyrights, and circuit layout licenses) of elpida memory, inc. or third parties by or arising from the use of the products or information listed in this document. no license, express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of elpida memory, inc. or others. descriptions of circuits, software and other related information in this document are provided for illustrative purposes in semiconductor product operation and application examples. the incorporation of these circuits, software and information in the design of the customer's equipment shall be done under the full responsibility of the customer. elpida memory, inc. assumes no responsibility for any losses incurred by customers or third parties arising from the use of these circuits, software and information. [product applications] elpida memory, inc. makes every attempt to ensure that its products are of high quality and reliability. however, users are instructed to contact elpida memory's sales office before using the product in aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment, medical equipment for life support, or other such application in which especially high quality and reliability is demanded or where its failure or malfunction may directly threaten human life or cause risk of bodily injury. [product usage] design your application so that the product is used within the ranges and conditions guaranteed by elpida memory, inc., including the maximum ratings, operating supply voltage range, heat radiation characteristics, installation conditions and other related characteristics. elpida memory, inc. bears no responsibility for failure or damage when the product is used beyond the guaranteed ranges and conditions. even within the guaranteed ranges and conditions, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as fail-safes, so that the equipment incorporating elpida memory, inc. products does not cause bodily injury, fire or other consequential damage due to the operation of the elpida memory, inc. product. [usage environment] this product is not designed to be resistant to electromagnetic waves or radiation. this product must be used in a non-condensing environment. if you export the products or technology described in this document that are controlled by the foreign exchange and foreign trade law of japan, you must follow the necessary procedures in accordance with the relevant laws and regulations of japan. also, if you export products/technology controlled by u.s. export control regulations, or another country's export control laws or regulations, you must follow the necessary procedures in accordance with such laws or regulations. if these products/technology are sold, leased, or transferred to a third party, or a third party is granted license to use these products, that third party must be made aware that they are responsible for compliance with the relevant laws and regulations. the information in this document is subject to change without notice. before using this document, confirm that this is the late st version.

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